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LifecyclePhase:
Device No.: DDF-0000404
Revision : 3
Expired Period: Forever
Prepared date: 2010/09/06 Prepared by: Sun Li
Release Date:2010-09-12 09:52:50.0
Technical Data Sheet
0.51" Triple Digit SMD Displays
ELST-505SYGWA/S530-E2/S290
Everlight Electronics Co., Ltd. http://www.everlight.com Rev. 3 Page: 6 of 8
⒈
Reliability test items and conditions:
The reliability of products shall be satisfied with items listed below.
Confidence level～90%
LTPD～10%
NO
Item
Test
Conditions
Test
Hours/Cycle
Sample
Size
Failure
Judgment
Criteria
Ac/Re
1
Reflow
Soldering
TEMP:260°C±5°C
Min. 5 SEC
6 Min
22 PCS
0/1
2
Temperature
Cycle
H～+100°C 15min
∫
5min
L～-40°C 15min
300 Cycles
22 PCS
0/1
3
Thermal
Shock
H～+100°C 5min
∫
10 sec
L～-10°C 5min
300 Cycles
22 PCS
0/1
4
High
Temperature
Storage
TEMP:105°C
1000 HRS
22PCS
0/1
5
Low
Temperature
Storage
TEMP:-40°C
1000 HRS
22 PCS
0/1
6
DC Operating
Life
TEMP:25°C
If
⑺10mA
1000 HRS
22 PCS
0/1
7
High
Temperature /
High
Humidity
85°C / 85% RH
1000 HRS
22 PCS
Iv⑻
Ivt*0.5
or
VF⑼
U
or
VF⑻
L
0/1
Note～Ivt～The test Iv value of the chip before the reliability test
Iv～The test value of the chip that has completed the reliability test
U～Upper Specification Limit
L～
Lower Specification Limit
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